Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1989-09-20
1992-02-04
Rosenberger, Richard A.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356239, 356376, G01B 1100
Patent
active
050855166
ABSTRACT:
The process involves comparing the shape of the edges of a curved object being monitored with that of a standard curved object. A reference is obtained by tracing an orthogonal projection of the standard curved object on a plane. The monitored object is placed face-to-face with the reference and the edges of both the reference and the monitored object are illuminated by a fan beam produced by a laser. The required measurements are performed on the basis of the thus-generated traces and the use of guide marks. The present invention also discloses an apparatus for carrying out the above process. A typical application of the invention is in the monitoring of window panels in the automobile industry.
REFERENCES:
patent: 3985454 (1976-10-01), Fletcher et al.
patent: 4446481 (1984-05-01), Edamatsu et al.
patent: 4492477 (1985-01-01), Leser
patent: 4647197 (1987-03-01), Kitaya et al.
patent: 4701047 (1987-10-01), Eibert et al.
patent: 4847510 (1989-07-01), Douglas
Optical Engineering, vol. 18, No. 1, Janvier/Febrier 1979 pp. 63-66; G. Indebetouw: "A Simple Optical Noncontact Profilometer".
Bertrand Gerard
Imbert Gerard
Narduzzo Gabriel
Pham Hoa
Rosenberger Richard A.
Societe Generale Pour les Techniques Nouvelles -SGN-
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