Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1977-01-24
1979-01-30
Corbin, John K.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356375, G01B 1130
Patent
active
041369572
ABSTRACT:
A recognition device for recognizing the shape and the position of an object includes means for applying a bundle of parallel light beams having a specific cross-section to a space containing the object, means for transducing the light informations from the space into image signals, means for extracting from said image signals a specific pattern corresponding to the portion to which the bundle of light beams is applied and means for determining the position of the pattern on the image surface, whereby the existence, shape and the position of the object are recognized from the information on the image surface.
REFERENCES:
patent: 3595220 (1971-07-01), Kawahara
patent: 3713739 (1973-01-01), Zarenkov et al.
patent: 3976382 (1976-08-01), Westby
patent: 4053234 (1977-10-01), McFarlane
Ejiri Masakazu
Ikeda Sadahiro
Uno Takeshi
Yasue Toshikazu
Corbin John K.
Hitachi , Ltd.
Rosenberger R. A.
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