LandOfFree - US Patents - Listing for Electronic digital logic circuitry,With test facilitating feature

Electronic digital logic circuitry – With test facilitating feature

Logic circuit including a plurality of master-slave...

Electronic digital logic circuitry – With test facilitating feature

Low overhead memory designs for IC terminals

Electronic digital logic circuitry – With test facilitating feature

Method and apparatus for providing security for debug circuitry

Electronic digital logic circuitry – With test facilitating feature

Method and apparatus for supplying a clock to a device under...

Electronic digital logic circuitry – With test facilitating feature

Method and apparatus for testing dynamic logic using an...

Electronic digital logic circuitry – With test facilitating feature

Method and apparatus for testing variable voltage and variable i

Electronic digital logic circuitry – With test facilitating feature

Method and circuitry for testing a programmable logic device

Electronic digital logic circuitry – With test facilitating feature

Method and structure for a fault-free input configuration contro

Electronic digital logic circuitry – With test facilitating feature

Method and system for detecting a mode of operation of an...

Electronic digital logic circuitry – With test facilitating feature

Method and system for disabling a scanout line of a register...

Electronic digital logic circuitry – With test facilitating feature

Method for contact pad isolation

Electronic digital logic circuitry – With test facilitating feature

Method for solid state thermal electric logic

Electronic digital logic circuitry – With test facilitating feature

Method for testing an electronic circuit by logically combining

Electronic digital logic circuitry – With test facilitating feature

Methods and apparatus for injecting an external clock into a...

Electronic digital logic circuitry – With test facilitating feature

Methods and circuits for precise edge placement of test signals

Electronic digital logic circuitry – With test facilitating feature

Micro-granular delay testing of configurable ICs

Electronic digital logic circuitry – With test facilitating feature

Multi-clock integrated circuit with clock generator and...

Electronic digital logic circuitry – With test facilitating feature

Multiple pattern sequence generation based on inverting non-line

Electronic digital logic circuitry – With test facilitating feature

Multiple voted logic cell testable by a scan chain and...