Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2007-07-24
2007-07-24
Chang, Daniel (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C714S724000, C713S168000
Reexamination Certificate
active
10638795
ABSTRACT:
The invention relates to debug circuitry (20) and more particularly to a method and apparatus for providing security for debug circuitry (20). In one embodiment, a plurality of non-volatile elements (38) are used in providing selective disabling and re-enabling of at least a portion of the debug circuitry (20). Authentication may also be used. The present invention may use any debug interface, including standard debug interfaces such as the JTAG debug interface defined by the IEEE.
REFERENCES:
patent: 5704039 (1997-12-01), Yhishay
patent: 7103782 (2006-09-01), Tugenberg et al.
patent: 2001/0015654 (2001-08-01), Habersetzer
patent: 2002/0018380 (2002-02-01), Shinmori
patent: 2002/0166061 (2002-11-01), Falik et al.
patent: 2002/0174342 (2002-11-01), Freeman et al.
patent: 2003/0005335 (2003-01-01), Watanabe
patent: 2003/0014653 (2003-01-01), Moller et al.
patent: 2003/0140205 (2003-07-01), Dahan et al.
patent: 2003/0140245 (2003-07-01), Dahan et al.
patent: 2004/0123118 (2004-06-01), Dahan et al.
Moyer William C.
Tkacik Thomas E.
Chang Daniel
Chiu Joanna G.
Freescale Semiconductor Inc.
Hill Susan C.
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