Method and apparatus for testing variable voltage and variable i

Details Method and apparatus for testing variable voltage and variable i Method and apparatus for testing variable voltage and variable i

1998-04-15

1999-12-07

Tokar, Michael

Electronic digital logic circuitry

With test facilitating feature

326 56, H03K 1900

Patent

active

059990139

ABSTRACT:
A tristate driver/receiver test circuit and an improved method are provided for parametric testing of variable voltage and variable impedance tristate driver and receiver circuits. The tristate driver/receiver test circuit includes a plurality of tristate driver/receiver pairs. The plurality of tristate driver/receiver pairs represent a plurality of parametrics including multiple voltage and impedance levels. A decoder having an input and an output enables one of the plurality of tristate driver/receiver pairs. The decoder output includes a plurality of decoder output lines. Each decoder output line is coupled to a respective one of the plurality of tristate driver/receiver pairs. Parametric select inputs are applied to the decoder input for selecting one of the plurality of tristate driver/receiver pairs. In the testing method, a first parametric test is performed. Then checking for special parametric tests is provided. Responsive to identifying special parametric tests, additional parametric tests are sequentially performed. The parametric select input is changed and an additional parametric test is performed until all parametrics are tested.

REFERENCES:
patent: 4841232 (1989-06-01), Graham et al.
patent: 5107230 (1992-04-01), King
patent: 5783963 (1998-07-01), Garnett et al.

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