Micro-granular delay testing of configurable ICs

Details Micro-granular delay testing of configurable ICs Micro-granular delay testing of configurable ICs

2010-05-23

2011-12-06

Tran, Anh (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S009000, C326S014000, C326S038000

Reexamination Certificate

active

08072234

ABSTRACT:
A method for testing a set of circuitry in an integrated circuit (IC) is described. The IC includes multiple configurable circuits for configurably performing multiple operations. The method configures the IC to operate in a user mode with a set of test paths that satisfies a set of evaluation criteria. Each test path includes a controllable storage element for controllably storing a signal that the storage element receives. The method operates the IC in user mode. The method reads the values stored in the storage elements to determine whether the set of circuitry is operating within specified performance limits.

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