Electronic digital logic circuitry – With test facilitating feature
Patent
1997-09-19
1999-03-16
Santamauro, John
Electronic digital logic circuitry
With test facilitating feature
326 40, 371 2232, H03K 1900, G01R 3128
Patent
active
058835245
ABSTRACT:
An integrated circuit includes a terminal which is accessible externally of the integrated circuit, and circuitry (LOB) coupled to said terminal and operable to latch at said terminal a signal applied to said terminal by a source (ICT) external to said integrated circuit.
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David George, "Use a Reprogrammable Approach to Boundary Scan for EPGAs", EDN Electrical Design News.
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