Semiconductor device

Details Semiconductor device Semiconductor device

2011-08-16

2011-08-16

Mandala, Victor (Department: 2826)

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

C257S758000, C257S784000, C257S786000, C257SE23020, C257SE23151, C257SE21521

Reexamination Certificate

active

07999256

ABSTRACT:
Electrode pads respectively have a probe region permitting probe contact and a non-probe region. In each of the electrode pads arranged zigzag in two or more rows, a lead interconnect for connecting another electrode pad with an internal circuit is not placed directly under the probe region but placed directly under the non-probe region.

REFERENCES:
patent: 6159826 (2000-12-01), Kim et al.
patent: 6844631 (2005-01-01), Yong et al.
patent: 7115985 (2006-10-01), Antol et al.
patent: 7397127 (2008-07-01), Lin et al.
patent: 7622364 (2009-11-01), Adkisson et al.
patent: 7626276 (2009-12-01), Hess et al.
patent: 2005/0161835 (2005-07-01), Maeda
patent: 2005/0218916 (2005-10-01), Hirai
patent: 2006/0157856 (2006-07-01), Ichikawa et al.
patent: 2006/0170105 (2006-08-01), Hirai
patent: 2006/0186405 (2006-08-01), Tanabe
patent: 2008/0303177 (2008-12-01), Wu et al.
patent: 10-074790 (1998-03-01), None

Affiliated with

Also associated with

Rating

Semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2739974