Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-07-28
2011-10-04
Shingleton, Michael (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C324S762100, C365S201000, C714S723000, C714S733000, C714S030000
Reexamination Certificate
active
08030649
ABSTRACT:
Various techniques for testing multicore processors in an integrated circuit. Each core includes a plurality of registers configured to form at least two scan chains. In one embodiment, a verification unit located in the integrated circuit is electrically coupled to outputs of the scan chains. The verification unit is configured to determine the validity of the outputs of the scan chains and to indicate a malfunction of the integrated circuit if the outputs are determined not to be valid.
REFERENCES:
patent: 6055655 (2000-04-01), Momohara
patent: 2008/0023700 (2008-01-01), Gschwind
International Business Machines - Corporation
Shingleton Michael
Stock William J.
Tuchman Ido
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