IC with comparator receiving expected and mask data from pads

Details IC with comparator receiving expected and mask data from pads IC with comparator receiving expected and mask data from pads

2007-02-27

2007-02-27

Smoot, Stephen W. (Department: 2813)

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

C324S765010

Reexamination Certificate

active

11103781

ABSTRACT:
Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response patterns from the tester are input to the test circuits along with the output response of the die/IC to be compared. The response patterns include one of expected data and mask data input on an output pad of the die/IC and the other of expected data and mask data input on another pad of the die/IC, which may be an input pad or an output pad. In addition to functional testing, scan testing of die and ICs is also possible.

REFERENCES:
patent: 6483758 (2002-11-01), Kim et al.
patent: 6717429 (2004-04-01), Whetsel
patent: 2000090692 (2000-03-01), None

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