Insert module for a test handler

Details Insert module for a test handler Insert module for a test handler

2011-08-30

2011-08-30

Ha, Nathan W (Department: 2814)

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

C257SE23002

Reexamination Certificate

active

08008661

ABSTRACT:
An insert module for a test handler includes an insert body and a support frame. The insert body has a receiving space for receiving a semiconductor device. The semiconductor device having connection pads protruding externally from a surface of the semiconductor device. The support frame is formed in an inner side portion of the insert body defining the receiving space to provide a seating surface for contacting and supporting the semiconductor device. The support frame includes a fixing frame and a guide pattern. The fixing frame is inserted into and fixed with the insert body and defines an opening that exposes the semiconductor device. The guide pattern extends from the fixing frame to the inside of the opening to contact the semiconductor device and guide the connection pads.

REFERENCES:
patent: 5825195 (1998-10-01), Hembree et al.
patent: 6262581 (2001-07-01), Han
patent: 6335629 (2002-01-01), Lee et al.
patent: 6909298 (2005-06-01), Gabriel et al.
patent: 7129722 (2006-10-01), Brophy et al.
patent: 7514946 (2009-04-01), Soeta et al.
patent: 7807481 (2010-10-01), Tashiro et al.
patent: 2007/0138466 (2007-06-01), Lee et al.
patent: 2009/0245982 (2009-10-01), Na et al.
patent: 11-186786 (1999-07-01), None
patent: 1019990029935 (1999-04-01), None
patent: 10-0243938 (1999-11-01), None
patent: 1020050061392 (2005-06-01), None

Affiliated with

Also associated with

Rating

Insert module for a test handler does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Insert module for a test handler, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Insert module for a test handler will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2753170