LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scatter attenuation tomography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scatter spectra method for x-ray fluorescent analysis with...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scattered radiation correction method and scattered...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scattered radiation imaging apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Self supporting optical diffraction grid

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Separate lateral processing of backscatter signals

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sequential x-ray crystal spectrometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Simplified system for local excitation by monochromatic x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Simultaneous measurement of the reflectivity of X-ray with...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Single corner kirkpatrick-baez beam conditioning optic assembly

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Single crystal orientation identifying and determining apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

SiO2-coated mirror substrate for EUV

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sliding sample cell insertion and removal apparatus for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Small angle x-ray scattering detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Snapshot backscatter radiography (SBR) systems including...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Snapshot backscatter radiography system and protocol

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Specimen holder

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spectral type radiation imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spectrometer arrangement