X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-01-18
2005-01-18
Church, Craig E. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S207000
Reexamination Certificate
active
06845147
ABSTRACT:
A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of:using an X-ray optical component between an X-ray source and a scattering target to obtain a first scatter spectrum;obtaining a second scatter spectrum from the same or a similar target without the X-ray optical component between the X-ray source and the scattering target; andcalculating the transfer function by the ratio of the first scatter spectrum to the second scatter spectrum. The method can be used to improve the accuracy of X-ray quantitative methods in an apparatus where an X-ray optical component is used between the X-ray source and the specimen to be investigated by utilizing the method described above.
REFERENCES:
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Elam William T.
Nicolosi Joseph A.
Scruggs Bruce E.
Shen Robert B.
Church Craig E.
EDAX Inc.
Yun Jurie
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