X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2011-03-22
2011-03-22
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S007000
Reexamination Certificate
active
07912180
ABSTRACT:
Scattered radiation is estimated by using a reduced image generated from a projection image, and the scattered radiation image of the projection image is acquired by enlargement processing. The scattered radiation correction of the projection image is executed by subtracting the obtained scattered radiation image from the projection image. In addition, when a primary X-ray image and a scattered radiation image in each projection direction are to be obtained by sequential approximation calculation, a primary X-ray image which has already been identified in an adjacent projection direction is used as a first estimated value (initially set value) in next sequential calculation.
REFERENCES:
patent: 4656650 (1987-04-01), Kikuchi et al.
patent: 6163589 (2000-12-01), Vartanian
patent: 2-56877 (1990-12-01), None
Ohishi Satoru
Sato Kozo
Silver Michael D.
Zou Yu
Kabushiki Kaisha Toshiba
Kiknadze Irakli
Oblon, Spivak, McCelland, Maier & Neustadt L.L.P.
Toshiba Medical Systems Corporation
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