Spectrometer arrangement

Details Spectrometer arrangement Spectrometer arrangement

2001-08-21

2003-07-22

Dunn, Drew A. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C359S575000, C356S328000

Reexamination Certificate

active

06597763

ABSTRACT:

CROSS-REFERENCE TO RELATED APPLICATIONS
This application claims priority from German Application Number 100-40-813.3 filed on Aug. 21, 2000.
BACKGROUND OF INVENTION
1. Field of the Invention
The invention relates generally to a spectrometer for the determination of a wavelength of a radiation emitted from a radiation source to be measured.
2. Background Art
Conventional spectrometers are used, among other things, to measure radiation spectra, i.e. to determine a wavelength-dependent intensity distribution of the radiation emitted from the radiation source. For this purpose, a dispersive element, such as a dispersion prism or a diffraction grating is used which deflects the incident beam to be measured by a wavelength-dependent angle. Thus, there is a spatial splitting of the radiation spectrum which can then be measured by disposing a location-sensitive radiation detector at a distance from the dispersive element or by moving a point detector having a comparatively small entry aperture in dependence on the location. In view of the known principle of the wavelength-dependent angle of deflection at the dispersive element, the location-dependent radiation intensity registered in this process can be converted to the wavelength-dependent intensity of the radiation, i.e. its spectrum.
SUMMARY OF INVENTION
A spectrometer arrangement is disclosed for the determination of a radiation wavelength of radiation emitted from a radiation source to be measured. The arrangement includes a diffraction grating on which the radiation of the radiation source to be measured is incident at a predetermined angle, wherein the diffraction grating is provided by a reflection grating having a variable lattice constant. The arrangement also includes a radiation detector for receiving from the radiation source to be measured radiation diffracted at a predetermined angle at the diffraction grating.
Other aspects and advantages of the invention will be apparent from the following description and the appended claims.


REFERENCES:
patent: 3051833 (1962-08-01), Schumacher
patent: 4910839 (1990-03-01), Wright
patent: 5343289 (1994-08-01), Crawford et al.
patent: 5880834 (1999-03-01), Chrisp
patent: 5914997 (1999-06-01), Van Egeraat
patent: 6226349 (2001-05-01), Schuster et al.

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