X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1987-10-09
1989-12-26
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 62, 378 99, G01T 136
Patent
active
048903108
ABSTRACT:
An x-ray having the energy bandwidth which extends between above and below the absorption edge energy of an element constituting a contrast agent is emitted from an x-ray source as an x-ray to be projected to an object, the x-ray at the higher energy component than the absorption energy of the contrast-agent constituting element is detected by one x-ray detector, the x-ray, having been transmitted through the one x-ray detector, at the lower energy component than the absorption edge energy of the contrast agent constituting element is detected by another x-ray detector, and a subtraction image is obtained by processing the image data from both detectors.
REFERENCES:
patent: 3974386 (1976-08-01), Mistretta et al.
patent: 4432370 (1984-02-01), Hughes et al.
patent: 4445226 (1984-04-01), Brody
patent: 4511799 (1985-04-01), Bjorkholm
patent: 4544949 (1985-10-01), Kurihara
patent: 4709382 (1987-11-01), Sones
Suzuki Ryuichi
Ueda Ken
Umetani Keiji
Yokouchi Hisatake
Fields Carolyn E.
Hitachi , Ltd.
Porta David P.
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