Sequential x-ray crystal spectrometer

Details Sequential x-ray crystal spectrometer Sequential x-ray crystal spectrometer

1985-04-22

1985-12-31

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 49, G01T 136

Patent

active

045625859

ABSTRACT:
A sequential x-ray spectrometer has a curved analyzer crystal and a position-sensitive detector. In order to obtain a high quantum yield or efficiency, an extensive suppression of scattered background radiation, and an increase of the measuring speed, the position-sensitive detector is arranged in a mobile fashion.

REFERENCES:
patent: 3663812 (1972-05-01), Koenig
patent: 4131794 (1978-12-01), Bruninx
patent: 4144450 (1979-03-01), Goebel
Siemens, "Rontgen-Analysengerate", Catalog MP 42, 1980.
Siemens-Werbebroschure MRS 400, No. E6892/1007, "Multichannel X-ray Spectrometer".
E. Bruninx, Philips Research Reports, "A Study of Different Geometries for the Seemann X-ray Spectrometer Equipped with a Position-Sensitive Detector", vol. 32, No. 4, (1977), pp. 253-265.
E. Bruninx Spektrochimica Acta, "X-ray Fluorescence Analysis by Means of Crystal Dispersion and a Position-Sensitive Counter", vol. 31B, (1976), pp. 221-223.

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