X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-10-31
2006-10-31
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S087000, C378S148000
Reexamination Certificate
active
07130374
ABSTRACT:
A snapshot backscatter radiography (SBR) system and related method includes at least one penetrating radiation source, and at least one substantially transmissive radiation detector. The substantially transmissive radiation detector is interposed between an object region to be interrogated and the radiation source. The substantially transmissive radiation detector receives and detects forward radiation from the radiation source before transmitting a portion thereof to interrogate the object region, wherein a portion of backscattered radiation provided by the object region is detected by the detector. A changeable collimating grid having a plurality of spaced apart radiation absorbing features is coupled to structure changing a position of the plurality of features and is disposed in at least one of the path of the forward radiation and the path of the backscattered radiation. An image of the object can be obtained by subtracting the forward radiation detected at the detector, or an estimate thereof, from a total of all radiation detected by the detector. Integrated circuit inspection, land mine detection, and luggage or cargo screening systems can all be SBR based.
REFERENCES:
patent: 6396902 (2002-05-01), Tybinkowski et al.
patent: 6735279 (2004-05-01), Jacobs et al.
Dugan Edward T.
Jacobs Alan M.
Akerman & Senterfitt
Jetter Neil R.
Midkiff Anastasia S.
Thomas Courtney
University of Florida Research Foundation Inc.
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