X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1998-02-19
2000-03-21
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 84, G21K 106
Patent
active
06041099&
ABSTRACT:
An x-ray reflecting system comprising a Kirkpatrick-Baez side-by-side optic in a single corner configuration having multi-layer Bragg x-ray reflective surfaces.
REFERENCES:
patent: 4174478 (1979-11-01), Franks
patent: 5027377 (1991-06-01), Thoe
patent: 5259013 (1993-11-01), Kuriyama et al.
XP-00210470-X-Ray Microscope with Multilayer Mirrors--James H. Underwood--Applied Optics--vol. 25, No. 11, Jun. 1, 1986.
XP-002104741-Meduim-Sized Grazing Incidence High-Energy X-Ray Telescope Employing Continuously Graded Multilayers--K. Joensen, P. Gorenstein, J. Susini, J. Wood, K. Parker--SPIE vol. 1736 X-Ray Detector Physics and Applications (1992) 239.
XP-002104742-GeoCARS Microfocusing Kirkpatrick-Baez Mirror Bender Development--B. Yang, M. Rivers, W. Schildkamp, P. Eng--1995 American Institute of Physics.
Gutman George
Jiang Licai
Verman Boris
Osmic, Inc.
Porta David P.
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