LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of setting measuring range of reciprocal-space mapping

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of standard-less phase analysis by means of a diffractogr

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method to determine the three-dimensional atomic structure...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method using x-rays to determine thickness of organic films

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods and apparatus for the identification of materials...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods and systems for determining the average atomic...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods and systems for determining the average atomic...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods and systems for determining the average atomic...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods and systems for the directing and energy filtering...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods for the design, quality control, and management of fatig

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods of transmission mode X-ray diffraction analysis and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Methods, a processor, and a system for improving an accuracy...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Microstrip gas chamber high-speed data acquisition system and me

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Mirror element for the reflection of x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Mirror mounting, alignment, and scanning mechanism and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Monochromatic x-ray micro beam for trace element mapping

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Monochromator and method of manufacturing the same

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Monochromator for an X-ray radiator allowing modification of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Monochromator for continuous spectrum x-ray radiation