Methods and systems for determining the average atomic...

Details Methods and systems for determining the average atomic... Methods and systems for determining the average atomic...

2007-09-12

2009-12-15

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S057000

Reexamination Certificate

active

07634058

ABSTRACT:
Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

REFERENCES:
patent: 5115459 (1992-05-01), Bertozzi
patent: 5420905 (1995-05-01), Bertozzi
International Search Report for PCT/US05/24372.

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