X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2011-08-02
2011-08-02
Midkiff, Anastasia (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S085000, C250S503100
Reexamination Certificate
active
07991116
ABSTRACT:
An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.
REFERENCES:
patent: 2688094 (1954-08-01), Dumond
patent: 4599741 (1986-07-01), Wittry
patent: 5175755 (1992-12-01), Kumakhov
patent: 5192869 (1993-03-01), Kumakhov
patent: 5497008 (1996-03-01), Kumakhov
patent: 5812631 (1998-09-01), Yan et al.
patent: 5892809 (1999-04-01), Wittry
patent: 6317483 (2001-11-01), Chen
patent: 6345086 (2002-02-01), Ferrandino et al.
patent: 6389107 (2002-05-01), Kantsyrev et al.
patent: 6504901 (2003-01-01), Loxley et al.
patent: 6678348 (2004-01-01), Kumakhov
patent: 6697454 (2004-02-01), Nicolich et al.
patent: 6934359 (2005-08-01), Chen et al.
patent: 6963072 (2005-11-01), Kumakhov
patent: 7110503 (2006-09-01), Kumakhov
patent: 2002/0021782 (2002-02-01), McDonald
patent: 2002/0027972 (2002-03-01), Joy et al.
patent: 2002/0159562 (2002-10-01), Holz
patent: 2 324 861 (1998-11-01), None
patent: 2004-333131 (2004-11-01), None
Hagelstein et al., “The Energy Calibration of X-Ray Absorption Spectra Using Multiple-Beam Diffraction”, Review of Scientific Instruments, vol. 63, No. 1, pp. 911-913 (Jan. 1992).
Shu et al., “VUV-SX Spherical Grating Monochromator for BEPC Beamline 4B9B”, Review of Scientific Instruments, vol. 60, No. 7, part 2B, pp. 2085-2088 (Jul. 1989).
Chen Zewu
Gao Ning
Gibson Walter
Heslin Rothenberg Farley & & Mesiti P.C.
Klembczyk, Esq. Jeffrey
Midkiff Anastasia
Radigan, Esq. Kevin P.
X-Ray Optical Systems, Inc.
LandOfFree
Monochromatic x-ray micro beam for trace element mapping does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Monochromatic x-ray micro beam for trace element mapping, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Monochromatic x-ray micro beam for trace element mapping will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2691217