X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-10-11
1997-04-29
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
G01N 2320
Patent
active
056256647
ABSTRACT:
Improved methods for managing a population of metal components subject to fatigue failure are provided. The residual compressive stress in the critical surfaces of such components, especially in areas of high stress concentration, are measured non-destructively using x-ray diffraction techniques. The measured surface residual compressive stress is used as a management criterion. A component having a surface residual compressive stress greater than a predetermined value can be returned to service. However, once the measured surface residual compressive stress of a component falls below the predetermined value, it can either be removed permanently from service, or it can be reworked to increase its surface residual compressive stress and then returned to service. Additionally, by measuring the surface residual compressive stress of an individual component, the remaining service life of that individual component can be estimated. These methods for management of populations of such metal components allow for increasing the service life of the components in a safe and effective manner. Methods are also provided for the manufacture and/or design of metal parts with improved performance criterion (e.g., reduction in weight) while maintaining acceptable service life. Methods are also provided for establishing quality control procedures using surface residual compressive stress measurements during and/or after the manufacturing process in order to prevent, for example, introduction of metal parts having insufficient surface residual compressive stress levels for their intended use.
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Fatigue Management Associates LLC
Wong Don
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