Method of setting measuring range of reciprocal-space mapping

Details Method of setting measuring range of reciprocal-space mapping Method of setting measuring range of reciprocal-space mapping

2006-02-14

2006-02-14

Bruce, David V. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S087000

Reexamination Certificate

active

06999557

ABSTRACT:
Reciprocal-space mapping measurement of X-ray diffraction requires setting of the measuring range of 2θ/ω and setting of the measuring range of ω. When the measuring range of ω is designated in absolute angle, the absolute-angle-designated range is converted into a relative-angle-designated range to be acquired; preventing setting of a warped measuring region. When the measuring range of ω is designated in relative angle, it is acquired as it is. For the measuring range of 2θ/ω, any one of the absolute-angle-designated range and the relative-angle-designated range may be acquired.

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