X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2011-04-12
2011-04-12
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S070000
Reexamination Certificate
active
07924977
ABSTRACT:
Methods, a processor, and a system for improving an accuracy of identification of a substance are described. One of the methods includes determining whether a relative molecular interference function of the substance includes at least one peak.
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Armstrong Teasdale LLP
Ho Allen C.
Morpho Detection Inc.
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