X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-02-22
2011-11-29
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S082000, C378S085000
Reexamination Certificate
active
08068582
ABSTRACT:
Systems and methods are disclosed herein for lenses based on crystal X-ray diffraction and reflection to be used to direct and energy filter X-ray beams.
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Bertozzi William
Korbly Stephen E.
Ledoux Robert J.
Foley & Hoag LLP
Ho Allen C.
Passport Systems, Inc.
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