X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-10-23
2007-10-23
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S057000
Reexamination Certificate
active
11177758
ABSTRACT:
Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.
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Bertozzi William
Ledoux Robert J.
Foley & Hoag LLP
Passport Systems, Inc.
Thomas Courtney
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