X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-05-10
2005-05-10
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S070000, C378S071000, C378S073000
Reexamination Certificate
active
06891925
ABSTRACT:
The invention presents an x-ray method for determining the three-dimensional molecular structure of molecules having an unknown structure. The molecules having unknown structure are arranged in a two-dimensional periodic array on a substrate molecular crystal having a known structure. It is a requirement of the method that the dimensions of the molecules with the unknown structure are smaller than the corresponding dimensions of the substrate crystal unit cell.
REFERENCES:
patent: 6430256 (2002-08-01), Yacoby
Bianco Paul D.
Fleit Martin
Fleit Kain Gibbbong Gutman Bongini & Bianco, P.L.
Glick Edward J.
Thomas Courtney
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