Test circuit in clock synchronous semiconductor memory device

Test circuit of semiconductor memory device

Test converage of embedded memories on semiconductor substrates

Test data topology write to memory using latched sense...

Test device

Test device for semiconductor memory circuit

Test device for semiconductor memory device

Test enable control for built-in self-test

Test for weak SRAM cells

Test interface circuit and semiconductor integrated circuit...

Test key for detecting overlap between active area and deep...

Test method and circuit for semiconductor memory

Test method for a semiconductor memory

Test method for contacts in SRAM storage circuits

Test method for ferroelectric memory

Test method for high speed memory devices in which limit...

Test method for semiconductor memory device and...

Test method of integrated circuit devices by using a dual edge c

Test mode activation and data override

Test mode activation and data override