Test method for semiconductor memory device and...

Details Test method for semiconductor memory device and... Test method for semiconductor memory device and...

2007-08-22

2009-12-15

Nguyen, Viet Q (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S203000, C365S207000, C365S206000

Reexamination Certificate

active

07633818

ABSTRACT:
The present invention detects a sense amplifier having an unbalanced characteristic. In a test method for a semiconductor memory device for detecting a sense amplifier having an unbalanced characteristic, an intermediate potential having different H and L levels from normal operation is restored in a first memory cell of a first bit line connected to a test target sense amplifier, charge quantity when the capacitance of the capacitor is small is virtually stored in the first memory cell, then the data of the first memory cell is read, and a malfunction of the sense amplifier is checked based on the presence of an error of read data.

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