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Consumption current circuit and method for memory device

Static information storage and retrieval – Read/write circuit – Testing
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Contact test method and system for memory testers

Static information storage and retrieval – Read/write circuit – Testing
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Control apparatus for testing a random access memory

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Controller for delay locked loop circuits

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Core test control

Static information storage and retrieval – Read/write circuit – Testing
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Current mode test circuit for SRAM

Static information storage and retrieval – Read/write circuit – Testing
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Current saturation test device

Static information storage and retrieval – Read/write circuit – Testing
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Data compression circuit and method for testing memory devices

Static information storage and retrieval – Read/write circuit – Testing
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Data compression circuit and method for testing memory devices

Static information storage and retrieval – Read/write circuit – Testing
Reissue Patent

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Data compression read mode for memory testing

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Data compression read mode for memory testing

Static information storage and retrieval – Read/write circuit – Testing
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Data compression read mode for memory testing

Static information storage and retrieval – Read/write circuit – Testing
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Data compression read mode for memory testing

Static information storage and retrieval – Read/write circuit – Testing
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Data compression read mode for memory testing

Static information storage and retrieval – Read/write circuit – Testing
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Data invert jump instruction test for built-in self-test

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Data output control circuit of semiconductor memory device havin

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Data path having grounded precharge operation and test...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Data retention test for static memory cell

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Data retention weak write circuit and method of using same

Static information storage and retrieval – Read/write circuit – Testing
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Data transfer circuit

Static information storage and retrieval – Read/write circuit – Testing
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