Data invert jump instruction test for built-in self-test

Details Data invert jump instruction test for built-in self-test Data invert jump instruction test for built-in self-test

1998-01-09

1999-09-14

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

36518902, G11C 700

Patent

active

059532726

ABSTRACT:
A data invert jump instruction test for a built-in self-test of a memory device is provided. The data invert system comprises a read only memory (72) operable to store a plurality of test algorithms wherein at least one of the test algorithms includes a data invert jump instruction (160). Also included is a data invert circuit (178) coupled to the read only memory (72) and a toggle register (188) within the data invert circuit (178). The toggle register (188) is set to one when the data invert jump instruction (160) occurs for the first time in the test algorithm. This causes the data invert circuit (178) to output the inverse of the data inputted through the data invert circuit (178).

REFERENCES:
patent: 5258986 (1993-11-01), Zerbe
patent: 5506959 (1996-04-01), Cockburn
patent: 5668815 (1997-09-01), Gittinger et al.
patent: 5675545 (1997-10-01), Madhavan et al.
patent: 5844914 (1998-12-01), Kim et al.

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