Contact test method and system for memory testers

Static information storage and retrieval – Read/write circuit – Testing

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Details

324 731, 371 211, G11C 700, G11C 2900

Patent

active

059562803

ABSTRACT:
A method and system for memory testers which detects the absence of contact between memory tester pins and memory module pins, and which identifies memory module pins which are shorted to a power supply terminal or to ground, pins which are shorted to other pins, and pins which are open.

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