Core test control

Details Core test control Core test control

1998-10-26

2000-05-09

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

36518912, 365221, G11C 700

Patent

active

060612843

ABSTRACT:
A integrated circuit (100) includes a plurality of cores (110, 120). With each core (110, 120) is associated a TCB (112, 122) for controlling the core in a test mode thereof. Each TCB has a shift register (220) for holding test control data. The TCBs (112, 122) are serially linked in a chain (140) so that, the test control data can be serially shifted in. A system TCB (130) is provided in the chain (140) comprising a further shift register (220). The system TCB (130) is connected to each TCB (112, 122) for, after receiving a particular set of test control data in its shift register (220), providing the TCBs (112, 122) with a system test hold signal for switching between a shift mode and an application mode of the TCBs (112, 122).

REFERENCES:
patent: 5130988 (1992-07-01), Wilcox et al.
patent: 5477545 (1995-12-01), Huang
patent: 5491666 (1996-02-01), Sturges

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