Current mode test circuit for SRAM

Details Current mode test circuit for SRAM Current mode test circuit for SRAM

1994-10-12

1996-05-21

Beausoliel, Jr., Robert W.

Static information storage and retrieval

Read/write circuit

Testing

371 225, 371 226, 371 404, 365202, G11C 2900

Patent

active

055197124

ABSTRACT:
A test circuit for a single chip semiconductor memory array, located in the chip, enables testing of all columns along a word lines without additional column readout circuits. A pair of current detecting differential amplifiers are connected to the bit lines of multiple memory cells along a word line, and the amplifier outputs are compared to generate a pass/fail signal during a read access.

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