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Nonvolatile semiconductor memory device and an optimizing progra

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory device and method for...

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory device and method of...

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory device having a status register

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory device with a row redundancy ci

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory device with backup memory...

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory having a stress test circuit

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory test circuit and method,...

Static information storage and retrieval – Read/write circuit – Testing
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Nonvolatile semiconductor memory with testing circuit

Static information storage and retrieval – Read/write circuit – Testing
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On-chip automatic procedures for memory testing

Static information storage and retrieval – Read/write circuit – Testing
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On-chip compression of charge distribution data

Static information storage and retrieval – Read/write circuit – Testing
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On-chip mobile ion contamination test circuit

Static information storage and retrieval – Read/write circuit – Testing
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On-chip mobile ion contamination test circuit

Static information storage and retrieval – Read/write circuit – Testing
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On-chip test circuitry for an ECL PROM

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On-die switchable test circuit

Static information storage and retrieval – Read/write circuit – Testing
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One-chip LSI including a general memory and a logic

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Package map data outputting circuit of semiconductor memory...

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Packet type integrated circuit memory devices having pins assign

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Parallel access testing of a memory array

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Parallel compression test circuit of memory device

Static information storage and retrieval – Read/write circuit – Testing
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