On-chip test circuitry for an ECL PROM

Details On-chip test circuitry for an ECL PROM On-chip test circuitry for an ECL PROM

1986-05-05

1988-03-15

Popek, Joseph A.

Static information storage and retrieval

Read/write circuit

Testing

365104, G11C 700

Patent

active

047317604

ABSTRACT:
An improved programmable read only memory having a plurality of input pins and a plurality of memory elements is provided for testing the functionality and performance of the device without programming the memory. One of a combination of input signals applied to the input pins selects one of the memory elements for providing an output representative of the state of the memory element. A test circuit is coupled between the input pins and both the memory elements and a plurality of test memory elements for deselecting the memory elements and selecting the test memory elements.

REFERENCES:
patent: 4459694 (1984-07-01), Ueno et al.
patent: 4543647 (1985-09-01), Yoshida

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