Static information storage and retrieval – Read/write circuit – Testing
Patent
1998-12-08
2000-06-20
Le, Vu A.
Static information storage and retrieval
Read/write circuit
Testing
36523006, G11C 700
Patent
active
060785365
ABSTRACT:
An integrated circuit memory device and method including a direct mode assigns internal data and address signals to separate pins. In particular, a plurality of first pins is assigned to the plurality of internal data signals that provide the data to the memory array in direct test mode. A plurality of second pins is assigned to the plurality of internal address signals that provide the address to the memory array in direct test mode, wherein none of the pins included in first plurality of pins are included in the second plurality of pins.
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patent: 5663661 (1997-09-01), Dillon et al.
patent: 5799209 (1998-08-01), Chatter
Kyung Kye-hyun
Lee Sung-joo
Moon Byung-sick
Le Vu A.
Samsung Electronics Co,. Ltd.
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