On-die switchable test circuit

Details On-die switchable test circuit On-die switchable test circuit

2006-02-21

2006-02-21

Lam, David (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S148000, C365S149000

Reexamination Certificate

active

07002859

ABSTRACT:
An information handling system includes a computer system having at least one integrated circuit formed on a die. The integrated circuit includes an output circuit and a device pin operably connected with the output circuit. A load resistor (or other type of load or termination component) and a test switch for selectively connecting the load resistor to the output circuit are also formed on the die. In one aspect, the load resistor is selected to correspond with a representative system load.

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