Package map data outputting circuit of semiconductor memory...

Details Package map data outputting circuit of semiconductor memory... Package map data outputting circuit of semiconductor memory...

2005-05-24

2005-05-24

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C365S230080, C365S189120, C365S240000, C365S225700

Reexamination Certificate

active

06898133

ABSTRACT:
A package map data outputting circuit of a semiconductor memory device embedded with a test circuit and a method for the same are provided. To improve the reliability of package map data and easily output a greater amount of the package map data, the package map data is stored to package map data registers at the wafer level and then output through the test circuit at the package level.

REFERENCES:
patent: 6357027 (2002-03-01), Frankowsky
patent: 6426904 (2002-07-01), Barth et al.

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