Error detection and correction method and apparatus in a...
Error detection on programmable logic resources
Error test for an address decoder of a non-volatile memory
Fabrication method of semiconductor device
Failure analysis system, fatal failure extraction method and rec
Failure self-diagnosis device for semiconductor memory
Failure test method for split gate flash memory
Fast internal reference cell trimming for flash EEPROM memory
Fault detection for entire wafer stress test
Fault locator architecture and method for memories
Feature control circuitry for testing integrated circuits
Ferroelectric memory bake for screening and repairing bits
Flash array implementation with local and global bit lines
Flash array implementation with local and global bit lines
Flash array implementation with local and global bit lines
Flash array implementation with local and global bit lines
Flash EEPROM with auto-function for automatically writing or era
Flash memory device capable of reducing test time and test...
Flash memory device having column predecoder capable of...
Flash memory device having mask ROM cells for self-test