Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-10-17
2006-10-17
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S185330, C365S230060
Reexamination Certificate
active
07123528
ABSTRACT:
A column predecoder includes a buffer unit for inputting all column selection signals, decoder units for decoding an output of the buffer unit and column addresses, and level shifters for shifting voltage levels of column selection signals coupled to gates of the column selection transistors in response to an output of the decoder units. Since a ground voltage is applied to a bitline and a high voltage is applied to all column selection signals during the stress test, the stress test time can be shortened.
REFERENCES:
patent: 5243569 (1993-09-01), Atsumi
patent: 5559744 (1996-09-01), Kuriyama et al.
patent: 5654925 (1997-08-01), Koh et al.
patent: 6236594 (2001-05-01), Kwon
patent: 04-163798 (1992-06-01), None
patent: 2002-58992 (2002-07-01), None
English Language of Abstract of Korean Patent Publication No. 2002-58992.
English Language of Abstract of Japanese Patent Publication No. 04-163798.
Jeong Jae-Yong
Lim Heung-Soo
Luu Pho M.
Marger & Johnson & McCollom, P.C.
Phung Anh
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