Flash memory device having column predecoder capable of...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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C365S185330, C365S230060

Reexamination Certificate

active

07123528

ABSTRACT:
A column predecoder includes a buffer unit for inputting all column selection signals, decoder units for decoding an output of the buffer unit and column addresses, and level shifters for shifting voltage levels of column selection signals coupled to gates of the column selection transistors in response to an output of the decoder units. Since a ground voltage is applied to a bitline and a high voltage is applied to all column selection signals during the stress test, the stress test time can be shortened.

REFERENCES:
patent: 5243569 (1993-09-01), Atsumi
patent: 5559744 (1996-09-01), Kuriyama et al.
patent: 5654925 (1997-08-01), Koh et al.
patent: 6236594 (2001-05-01), Kwon
patent: 04-163798 (1992-06-01), None
patent: 2002-58992 (2002-07-01), None
English Language of Abstract of Korean Patent Publication No. 2002-58992.
English Language of Abstract of Japanese Patent Publication No. 04-163798.

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