Feature control circuitry for testing integrated circuits

Details Feature control circuitry for testing integrated circuits Feature control circuitry for testing integrated circuits

2007-11-27

2007-11-27

Dinh, Son (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189110, C365S189120, C714S727000

Reexamination Certificate

active

11257861

ABSTRACT:
An integrated circuit is provided that includes testing circuitry for testing input-output circuits. The integrated circuit contains input-output circuits that each have associated input-output pins and input and output buffers. Each input-output circuit has associated features such as a weak pull-up feature, a voltage clamp diode feature, a bus hold feature, an open-drain feature, a differential input termination resistance feature, and a single-ended/differential mode selection feature. An input-output feature control register receives input-output circuit feature selection instructions. The feature selection instructions contain feature selection bits whose values determine which of the input-output circuit features are enabled in a set of input-output circuits for testing on the integrated circuit. The feature selection instructions can selectively enable one or more input-output circuit features in each input-output circuit. Different feature selection instructions can be loaded into the feature control register to systematically test the input-output circuit features.

REFERENCES:
patent: 6215689 (2001-04-01), Chhor et al.
patent: 6851079 (2005-02-01), Hergott
patent: 6885963 (2005-04-01), Arnold et al.
patent: 6886121 (2005-04-01), Dervisoglu et al.
patent: 6886122 (2005-04-01), Barthel
patent: 6920627 (2005-07-01), Blodget et al.
patent: 6928606 (2005-08-01), Savaria et al.
patent: 6934898 (2005-08-01), Goff
patent: 6959428 (2005-10-01), Broberg, III et al.
patent: 2004/0264227 (2004-12-01), Kojima et al.
patent: 2006/0179373 (2006-08-01), Ishikawa

Affiliated with

Also associated with

Rating

Feature control circuitry for testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Feature control circuitry for testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Feature control circuitry for testing integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3831635