Fabrication method of semiconductor device

Details Fabrication method of semiconductor device Fabrication method of semiconductor device

2005-11-08

2005-11-08

Nguyen, Viet Q. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S051000, C365S042000, C365S094000

Reexamination Certificate

active

06963513

ABSTRACT:
The present invention provides a technology capable of shortening a TAT of a microcomputer with a nonvolatile memory built therein and achieving a reduction in cost. Flash ROMs comprising memory cells each substantially identical in structure to each of memory cells of a flash memory are formed in their corresponding chips lying in a wafer. Subsequently, memory information is written into each of the memory cells of the flash ROM in a probe test process. Thereafter, the memory information written into the memory cell thereof is made unreprogrammable to thereby disable rewriting of the post-shipment memory information. Thus, the shortening of a TAT can be achieved as compared with a mask ROM built-in microcomputer, and management and fabrication costs can be reduced.

REFERENCES:
patent: 5581510 (1996-12-01), Furusho et al.
patent: 5726920 (1998-03-01), Chen et al.
patent: 6180425 (2001-01-01), Mielke et al.
patent: 6181615 (2001-01-01), Chhor
patent: 6198657 (2001-03-01), Uekubo et al.
patent: 6367042 (2002-04-01), Phan et al.
patent: 6412072 (2002-06-01), Little et al.
patent: 6436741 (2002-08-01), Sato et al.
patent: 6473345 (2002-10-01), Hayasaka et al.
patent: 6551844 (2003-04-01), Eldridge et al.
patent: 6580092 (2003-06-01), Tomishima
patent: 6597602 (2003-07-01), Imamiya et al.
patent: 6661712 (2003-12-01), Hiraki et al.
patent: 6815322 (2004-11-01), Yamamoto et al.
patent: 6825052 (2004-11-01), Eldridge et al.
patent: 6829737 (2004-12-01), McBride
patent: 6885599 (2005-04-01), Saitoh et al.
patent: 2002/0097611 (2002-07-01), Hayasaka et al.
patent: 2003/0122550 (2003-07-01), Kanamaru et al.
patent: 2004/0181724 (2004-09-01), McBride
patent: 59-222952 (1984-12-01), None
patent: 4-78173 (1992-03-01), None
patent: 05-304277 (1993-11-01), None
patent: 07-283287 (1995-10-01), None

Affiliated with

Also associated with

Rating

Fabrication method of semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fabrication method of semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fabrication method of semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3508437