Flash EEPROM with auto-function for automatically writing or era

Details Flash EEPROM with auto-function for automatically writing or era Flash EEPROM with auto-function for automatically writing or era

1995-04-25

1996-11-26

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

36518514, 36518522, 36518529, G11C 700

Patent

active

055792707

ABSTRACT:
A non-volatile semiconductor memory with an auto-function for automatically writing or erasing data includes a logic circuit, a select circuit and a test-mode control section. The test-mode control section responds to a plurality of signals transmitted from the outside of the memory for outputting a second verify signal indicating that a verify result is normal, a third verify signal indicating that the verify result is abnormal, and a select signal for selecting an external clock signal from the outside of the memory. The logic circuit forcibly sets to a predetermined value a first verify signal output from a verify circuit on the basis of the second and third verify signals output from the test-mode control section. The select circuit selects, in a normal mode, a clock signal output from an oscillator, and selects, in a test mode, the external clock signal. The number of repetitions of retrial is set irrespective of the verify signal output from the verify circuit.

REFERENCES:
patent: 5053990 (1991-10-01), Kreifels et al.
patent: 5233562 (1993-08-01), Ong et al.
"ISSCC91/Session 16/Non-Volatile And Specialty Memory/Paper FA 16.1" 1991 IEEE International Solid-State Circuits Conference, pp. 260-261 (1991).

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