Failure analysis system, fatal failure extraction method and rec

Details Failure analysis system, fatal failure extraction method and rec Failure analysis system, fatal failure extraction method and rec

1999-09-22

2000-08-22

Mai, Son

Static information storage and retrieval

Read/write circuit

Testing

365200, 714718, 714799, G11C 2900

Patent

active

061082538

ABSTRACT:
An EWS for data analysis automatically performs automatic fatal failure extract processing on the basis of FBM information accumulated in a computer for a tester. In the automatic fatal failure extract processing, X-line repair judgment processing and Y-line repair judgment processing are continuously performed so that the X-line repair processing is performed in consideration of failures in a Y-line direction, and the Y-line repair judgment processing is performed in consideration of failures in an X-line direction. Further, the failures in the Y-line and X-line directions are taken into consideration from maximum ability decided by Y-line substitutability and X-line substitutability to zero. Thus provided is a failure analysis system capable of automatically investigating the cause for fatal failures.

REFERENCES:
patent: 5844850 (1998-12-01), Tsutsui et al.
patent: 5946214 (1999-08-01), Heavlin et al.
patent: 6009545 (1999-12-01), Tsutsui et al.

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