Semiconductor memory device incorporating a test mechanism

Semiconductor memory device incorporating a test mode therein to

Semiconductor memory device input circuit

Semiconductor memory device of which prescribed state of operati

Semiconductor memory device performing redundancy repair...

Semiconductor memory device provided with test memory cell unit

Semiconductor memory device providing reduced test time

Semiconductor memory device reading data based on memory...

Semiconductor memory device shiftable to test mode in module...

Semiconductor memory device test circuit having an improved comp

Semiconductor memory device tester

Semiconductor memory device that can carry out read disturb test

Semiconductor memory device utilizing multiple edges of a...

Semiconductor memory device which controls sense amplifier...

Semiconductor memory device with a built-in test circuit

Semiconductor memory device with a rapid packet data input,...

Semiconductor memory device with a reference or dummy cell...

Semiconductor memory device with an improved multi-bit test mode

Semiconductor memory device with built-in self test circuit

Semiconductor memory device with built-in self-diagnostic...