Semiconductor memory device incorporating a test mechanism
Semiconductor memory device incorporating a test mode therein to
Semiconductor memory device input circuit
Semiconductor memory device of which prescribed state of operati
Semiconductor memory device performing redundancy repair...
Semiconductor memory device provided with test memory cell unit
Semiconductor memory device providing reduced test time
Semiconductor memory device reading data based on memory...
Semiconductor memory device shiftable to test mode in module...
Semiconductor memory device test circuit having an improved comp
Semiconductor memory device tester
Semiconductor memory device that can carry out read disturb test
Semiconductor memory device utilizing multiple edges of a...
Semiconductor memory device which controls sense amplifier...
Semiconductor memory device with a built-in test circuit
Semiconductor memory device with a rapid packet data input,...
Semiconductor memory device with a reference or dummy cell...
Semiconductor memory device with an improved multi-bit test mode
Semiconductor memory device with built-in self test circuit
Semiconductor memory device with built-in self-diagnostic...