Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-03-04
2010-02-02
Robinson, Mark A (Department: 4175)
Static information storage and retrieval
Read/write circuit
Testing
C365S210100, C365S189070, C365S149000
Reexamination Certificate
active
07656730
ABSTRACT:
A semiconductor memory device includes: memory cells respectively arranged on intersecting points of a plurality of word lines and a plurality of data lines, and respectively having a capacitor for storing data; a sense amplifier provided in between the data lines forming a data line pair so as to amplify an electric potential difference between the data lines and to perform data reading; and a test memory cell arranged on each of the data lines and having a test capacitor with a capacitance value set smaller than the above capacitor, and when performing a test for a memory cell, inversed data of the data to be stored into a target memory cell of a test target is pre-written into the test memory cell.
REFERENCES:
patent: 2005/0063213 (2005-03-01), Jacob et al.
patent: 0759620 (1996-08-01), None
patent: 1143457 (2001-10-01), None
patent: 2004-103119 (2004-04-01), None
Elpida Memory Inc.
Norman James G
Robinson Mark A
Sughrue & Mion, PLLC
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