Redistribution process
Reduce 1/f noise in NPN transistors without degrading the...
Reduce line end pull back by exposing and etching space...
Reduced area intersection between electrode and programming...
Reduced area intersection between electrode and programming...
Reduced aspect ratio digit line contact process flow used...
Reduced barrier photodiode/gate device structure for high...
Reduced bird's beak field oxidation process using nitrogen impla
Reduced boron diffusion by use of a pre-anneal
Reduced cap layer erosion for borderless contacts
Reduced cell-to-cell shorting for memory arrays
Reduced cell-to-cell shorting for memory arrays
Reduced channel length for a high performance CMOS transistor
Reduced channel length lightly doped drain transistor using a su
Reduced contact area of sidewall conductor
Reduced cross-contamination between chambers in a...
Reduced cross-contamination between chambers in a...
Reduced dark current photodetector
Reduced defect semiconductor-on-insulator hetero-structures
Reduced deformation of micromechanical devices through...