L-U Arm handle assembly

Large collection angle x-ray monochromators for electron...

Large-field scanning of charged particles

Large-field scanning of charged particles

Laser fault correction of semiconductor devices

Laser scanning microscope and shutter for an optical system

Lattice strain measuring system and method

Layered electron beam column and method of use thereof

Lens for a scanning electron microscope

Lens system for a photo ion spectrometer

Lens system for phase plate for transmission electron...

Lift-out probe having an extension tip, methods of making...

Light receiving and emitting probe and light receiving and...

Light weight portable scanning electron microscope

Line-width measurement adjusting method and scanning...

Line-width measurements of metallization coated with insulator o

Lithographic apparatus and device manufacturing method

Lithographic apparatus and device manufacturing method

Lithographic apparatus and device manufacturing method

Lithographic apparatus and device manufacturing method